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The scanning electron microscopy hardware consists of a variable pressure JEOL model “5900LV” equipped with a large specimen chamber, a 5-axis computer-controlled stage,  BEI and SEI detectors, a Noran EDS detector for elements, Z>=4, and a CCD camera for electron back-scattered diffraction (“EBSD”).

Software includes JEOL digital image processing software, the Noran Vantage system for elemental mapping and analysis, and the Noran EBSD software.
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